Robust Reconfigurable Scan Networks
Robust Reconfigurable Scan Networks
复制标题
强大的可重构扫描网络
DOI:
10.23919/date54114.2022.9774770
复制
发表时间:
2022
期刊:
影响因子:
--
通讯作者:
H. Wunderlich
中科院分区:
文献类型:
--
作者:
N. Lylina;Chih;H. Wunderlich
Reconfigurable Scan Networks (RSNs) access the evaluation results from embedded instruments and control their operation throughout the device lifetime. At the same time, a single fault in an RSN may dramatically reduce the accessibility of the instruments. During post-silicon validation, it may prevent extracting the complete data from a device. During online operation, the inaccessibility of runtime-critical instruments via a defect RSN may eventually result in a system failure. This paper addresses both scenarios above by presenting robust RSNs. We show that by making a small number of carefully selected spots in RSN s more robust, the entire access mechanism becomes significantly more reliable. A flexible cost function assesses the importance of specific control primitives for the overall accessibility of the instruments. Following the cost function, a minimized number of spots is hardened against permanent faults. All the critical instruments as well as most of the remaining instruments are accessible through the resulting RSNs even in the presence of defects. In contrast to state-of-the-art fault-tolerant RSNs, the presented scheme does not change the RSN topology and needs less hardware overhead. Selective hard-ening is formulated as a multi-objective optimization problem and solved by using an evolutionary algorithm. The experimental results validate the efficiency and the scalability of the approach.