Temperature dependence of the first order Raman scattering in thin films of μc-Si:H
Temperature dependence of the first order Raman scattering in thin films of μc-Si:H
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DOI:
10.1016/s0924-0136(99)00152-1
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发表时间:
1999-08
影响因子:
6.3
通讯作者:
M. Cerqueira;J. Ferreira
中科院分区:
文献类型:
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作者:
M. Cerqueira;J. Ferreira