Estimating error in measuring thermal conductivity using a T-type nanosensor
Estimating error in measuring thermal conductivity using a T-type nanosensor
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DOI：
10.1002/htj.20228
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发表时间：
2009-07
影响因子：
1.7
通讯作者：
Yôhei Itô;Koji Takahashi;M. Fujii;Xing Zhang
中科院分区：
文献类型：
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作者：
Yôhei Itô;Koji Takahashi;M. Fujii;Xing Zhang
我们讨论的测量误差所造成的T型纳米传感器的制造和测量与悬浮的亚微米铂热膜，开发来测量单个纳米线材料的热性能。数值模拟和一维分析的比较显示，纳米线材料如碳纳米管的热导率计算为低17%。作为一个例子，SiC纳米线的热导率测量结果的报告。由接触热阻引起的误差被发现依赖于接触长度，可以高达20%。可以说，通过校正估计的测量误差，未来的测量可以具有更高的可靠性。© 2009 Wiley Periodicals，Inc. Heat Trans Asian Res;在线发表于Wiley InterScience（www.interscience.wiley.com）。DOI 10.1002/htj.20228
We discuss the measurement error caused by fabrication and measurement of a T-type nanosensor with a suspended sub-micrometer Pt hot film that was developed to measure the thermal properties of individual nanowire materials. Comparison of numerical simulation and one-dimensional analysis revealed that the thermal conductivity of nanowire material such as a carbon nanotube is calculated to be 17% lower. As an example, the thermal conductivity measurement result for a SiC nanowire is reported. The error caused by contact thermal resistance is found to depend on the contact length and can be as great as 20%. It can be said that future measuring can have higher reliability by correcting the estimated measurement error. © 2009 Wiley Periodicals, Inc. Heat Trans Asian Res; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/htj.20228