Lorentz TEM Imaging of Stripe Structures Embedded in a Soft Magnetic Matrix
Lorentz TEM Imaging of Stripe Structures Embedded in a Soft Magnetic Matrix
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DOI：
10.1103/physrevapplied.4.034012
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发表时间：
2015-09-29
影响因子：
4.6
通讯作者：
McCord, J.
中科院分区：
文献类型：
--
作者：
Basith, M. A.;McVitie, S.;McCord, J.
通过高分辨率洛伦兹透射电子显微成像研究了被 NiFe 薄膜包围的软磁 NiFe/NiFeGa 混合条纹结构中的尼尔壁。通过在磁化反转过程中形成高角度磁畴壁，可以观察到 1000 nm 宽的相邻未辐照条带中磁化强度的反平行方向。将条带结构尺寸从 1000 nm 缩小到 200 nm 后，观察到外部磁场反转从离散域图案到有效磁介质的转变。这种转变与相邻条带之间的高角度畴壁的消失能力有关。
Neel walls in soft magnetic NiFe/NiFeGa hybrid stripe structures surrounded by a NiFe film are investigated by high-resolution Lorentz transmission-electron-microscopic imaging. An antiparallel orientation of magnetization in 1000-nm-wide neighboring unirradiated-irradiated stripes is observed by forming high-angle domain walls during magnetization reversal. Upon downscaling the stripe structure size from 1000 to 200 nm, a transition from a discrete domain pattern to an effective magnetic medium is observed for external magnetic-field reversal. This transition is associated with the vanishing ability of hosting high-angle domain walls between adjacent stripes.