Dicarbon antisite defect in n-type 4H-SiC
Dicarbon antisite defect in n-type 4H-SiC
复制标题
n型4H-SiC中的二碳反位缺陷
DOI:
10.1103/physrevb.79.115211
复制
发表时间:
2009
影响因子:
3.7
通讯作者:
Á. Gali
中科院分区:
文献类型:
--
作者:
T. Umeda;J. Isoya;N. Morishita;T. Ohshima;E. Janzén;Á. Gali
We identify the negatively charged dicarbon antisite defect (C-2 core at silicon site) in electron-irradiated n-type 4H-SiC by means of combined electron paramagnetic resonance (EPR) measurements a ...