Primary study on the contact degradation mechanism of CdZnTe detectors
Primary study on the contact degradation mechanism of CdZnTe detectors
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DOI：
10.1016/j.nima.2004.03.200
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发表时间：
2004-07
影响因子：
1.4
通讯作者：
Wen-bin Sang;Jin Wei;Zhang Qi;Li Wanwan;Min Jiahua;T. Jianyong;Qian Yong-biao
中科院分区：
文献类型：
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作者：
Wen-bin Sang;Jin Wei;Zhang Qi;Li Wanwan;Min Jiahua;T. Jianyong;Qian Yong-biao
金属-镉锌碲(CZT)界面在决定接触特性方面起着至关重要的作用，而接触特性往往是影响探测器性能的主要因素。本文研究了金属接触层与CZT表面界面层退化对CZT材料力学性能和电学性能的影响。采用三维有限元方法对界面热应力进行了模拟。结果表明，最大热应力集中在电极中部，不同电极材料产生的应力大小顺序为Al>；Au&Gt；Pt&Gt；In。利用DAGE PC2400型显微试验机，采用剪切法测量了金属接触层与CZT表面的结合力。利用愤怒深度分布确定了金属接触层与CZT之间的互扩散。实验结果表明，在p型高阻CZT上化学镀Au电极与溅射Au相比，界面结合强度较小，但具有较好的欧姆效应。此外，还考察了老化对探测器接触特性的影响。
The metal–CdZnTe (CZT) interface plays a vital role in determining the contact characteristics, which is often the dominant factor influencing detector performance. The effects of the degradation of the interfacial layer between the metal contact layer and CZT surface on the mechanical and electrical properties have been investigated in this paper. The interfacial thermal stresses were simulated using 3-D finite element method (FEM). The results indicate that the maximum thermal stress is concentrated on the midst of the electrode and the magnitude of the stress produced by the different electrode materials in order is Al>Au>Pt>In. The adhesion forces between the metal contact layer and CZT surface were measured by using a Dage PC2400 Micro tester with the shear-off-method. The inter-diffusion between the metal contact layer and CZT was identified using the Anger depth profiles. The experimental results indicate that the electroless Au electrode on p-type high resistivity CZT is of smaller interfacial adhesion strength, but of better ohmicity than the sputtered Au. In addition, the aging effects on the contact characteristics of the detector were also examined.