Structural studies of zirconium alkylphosphonate monolayers and multilayer assemblies
Structural studies of zirconium alkylphosphonate monolayers and multilayer assemblies
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DOI:
10.1021/la00032a042
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发表时间:
1993-08
期刊:
影响因子:
3.9
通讯作者:
M. Schilling;H. Katz;S. Stein;S. Shane;W. Wilson;S. Buratto;S. Ungashe;G. Taylor;T. M. Putvinski;C. Chidsey
中科院分区:
文献类型:
--
作者:
M. Schilling;H. Katz;S. Stein;S. Shane;W. Wilson;S. Buratto;S. Ungashe;G. Taylor;T. M. Putvinski;C. Chidsey
Zirconium organophosphonates form thermally stable surface multilayers of predictable ellipsometric thickness. Fluorescence and nonlinear optical properties of dyes incorporated in such films indicate organized structures; however, other data place limits on the degree of order obtained. Here, we present evidence gleaned from IR, XPS, and cyclic voltammetry that Zr phosphonate multilayers are less perfect than previously thought and contain defects arising in the initial stages of film growth. We still consider the transition metal phosphonate matrix to be attractive for constructingnovel optical materials, but in fabricating active structures it will be necessary to compensate for defects. Approaches to doing so are under evaluation.