Direct Visualization of Interfacial Regions between Fillers and Matrix in Rubber Composites Observed by Atomic Force Microscopy-Based Nanomechanics Assisted by Electron Tomography
Direct Visualization of Interfacial Regions between Fillers and Matrix in Rubber Composites Observed by Atomic Force Microscopy-Based Nanomechanics Assisted by Electron Tomography
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DOI：
10.1021/acs.langmuir.1c02788
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发表时间：
2021-12-25
期刊：
影响因子：
3.9
通讯作者：
Jinnai, Hiroshi
中科院分区：
文献类型：
--
作者：
Ito, Makiko;Liu, Haonan;Jinnai, Hiroshi
为了解释或预测具有复杂纳米结构的聚合物复合材料的宏观力学性能，基于原子力显微镜（AFM）的纳米力学是最合适的工具之一，因为它可以获得局部的力学性能，但基于接触力学的自动力曲线分析会误导我们得出错误的结论。本研究的目的是阐明这一点，通过应用原子力显微镜纳米力学的炭黑（CB）增强异戊二烯橡胶（IR）。橡胶表面下的CB聚集体使我们无法定量评估CB和界面聚合物区域（IPR）的比率，这是决定宏观力学性能的重要参数。为了克服这个问题，透射电子显微断层扫描被纳入到调查的3D结构在同一领域的AFM纳米力学。结果发现，存在未出现在AFM形貌图像中的掩埋结构。此外，我们能够揭示存在一个拐点的力曲线，这是这种"假"知识产权的特点。换句话说，我们通过结合这些最先进的技术，首次证明了真正的知识产权的存在。
In order to explain or predict the macroscopic mechanical properties of polymer composites with complex nanostructures, atomic force microscopy (AFM)-based nanomechanics is one of the most appropriate tools because the local mechanical properties can be obtained by it. However, automatic force curve analysis based on contact mechanics would mislead us to the wrong conclusion. The purpose of this study is to elucidate this point by applying AFM nanomechanics on a carbon black (CB)-reinforced isoprene rubber (IR). The CB aggregates underneath the rubber surface prevent us from quantitatively evaluating the ratio of CB and interfacial polymer region (IPR), which is an important parameter to determine the macroscopic mechanical properties. In order to overcome this problem, transmission electron microtomography was incorporated to investigate the 3D structure in the same field of view as AFM nanomechanics. As a result, it was found that there are buried structures that do not appear in the AFM topographic image. In addition, we were able to reveal the existence of a force curve with an inflection point, which is characteristic of such "false" IPRs. To put it another way, we evidenced the existence of true IPRs for the first time by combining these state-of-the-art techniques.