Surface differential reflectivity for studying surface state optical transitions—a review
Surface differential reflectivity for studying surface state optical transitions—a review
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用于研究表面态光学跃迁的表面微分反射率——综述
DOI：
10.1088/0953-8984/16/39/001
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发表时间：
2004
期刊：
影响因子：
--
通讯作者：
A. Cricenti
中科院分区：
文献类型：
--
作者：
A. Cricenti
本文综述了半导体表面微分反射率（SDR）的研究方法。我们将描述该技术的原理和实验装置，以及有关SDR与表面微观特性联系的一些理论考虑。特别是，SDR的分析是在一个宏观的三层模型，其中所涉及的介质（真空，表面和基板）被假定为具有一定的各向异性介电函数的框架。将展示一些实验结果，表明该技术的潜力。
In this paper we present an overview of the method of surface differential reflectivity (SDR) for the study of semiconductor surfaces. We will describe the principles of the technique and the experimental apparatus together with some theoretical considerations concerning the connection of SDR with the microscopic properties of the surface. In particular, the analysis of SDR is done in the frame of a macroscopic three layers model in which the media involved (vacuum, surface and substrate) are assumed to have definite anisotropic dielectric functions. A few experimental results, indicative of the potential of the technique, will be shown.