Full temperature calibration from 4 to 300 K of the voltage response of piezoelectric tube scanner PZT‐5A for use in scanning tunneling microscopes
Full temperature calibration from 4 to 300 K of the voltage response of piezoelectric tube scanner PZT‐5A for use in scanning tunneling microscopes
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用于扫描隧道显微镜的压电管扫描仪 PZT-5A 的电压响应从 4 到 300 K 的全温度校准
DOI：
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发表时间：
1993
期刊：
影响因子：
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通讯作者：
G. Crabtree
中科院分区：
文献类型：
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作者：
K. Vandervoort;R. Zasadzinski;G. Galicia;G. Crabtree
我们已经校准了我们的压电扫描管（PZT-5A）的位移/电压（A/V）响应，通过在4至300 K之间的40多个温度下对石墨进行成像。我们还在室温下校准了（A/V）响应与高达220 V电压的函数，对镀金衍射光栅进行成像。我们发现，（A/V）响应的温度依赖性在10%以内是线性的，并且随着温度从300 K降低到4.2 K而减小5.5倍。（A/V）响应与温度的接近线性关系使PZT-5A锆钛酸铅成分成为低温扫描隧道显微镜压电管元件的方便选择。
We have calibrated the displacement/voltage (A/V) response of our piezoelectric scanning tube (PZT‐5A) by imaging graphite at over 40 temperatures between 4 and 300 K. We have also calibrated the (A/V) response as a function of voltage up to 220 V at room temperature, imaging a gold‐plated diffraction grating. We find that the temperature dependence of the (A/V) response is linear to within 10% and is reduced by a factor of 5.5 on decreasing temperature from 300 to 4.2 K. The near linearity with temperature of the (A/V) response makes the PZT‐5A lead zirconate titanate composition a convenient choice for low temperature scanning tunneling microscope piezo tube elements.