Linear polarization scans for resonant X-ray diffraction with a double-phase-plate configuration.
Linear polarization scans for resonant X-ray diffraction with a double-phase-plate configuration.
复制标题
使用双相位板配置进行共振 X 射线衍射的线性偏振扫描。
DOI:
10.1107/s0909049509035006
复制
发表时间:
2009
影响因子:
2.5
通讯作者:
F. de Bergevin
中科院分区:
文献类型:
--
作者:
V. Scagnoli;C. Mazzoli;C. Detlefs;P. Bernard;A. Fondacaro;L. Paolasini;F. Fabrizi;F. de Bergevin
An in-vacuum double-phase-plate diffractometer for performing polarization scans combined with resonant X-ray diffraction experiments is presented. The use of two phase plates enables the correction of some of the aberration effects owing to the divergence of the beam and its energy spread. A higher rate of rotated polarization is thus obtained in comparison with a system with only a single retarder. Consequently, thinner phase plates can be used to obtain the required rotated polarization rate. These results are particularly interesting for applications at low energy (e.g. 4 keV) where the absorption owing to the phase plate(s) plays a key role in the feasibility of these experiments. Measurements by means of polarization scans at the uranium M(4) edge on UO(2) enable the contributions of the magnetic and quadrupole ordering in the material to be disentangled.