Physical and chemical effects on crystalline H2O2 induced by 20 keV protons.
Physical and chemical effects on crystalline H2O2 induced by 20 keV protons.
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20 keV 质子对结晶 H2O2 的物理和化学影响。
DOI：
10.1063/1.3079612
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发表时间：
2009
期刊：
影响因子：
--
通讯作者：
R. Baragiola
中科院分区：
文献类型：
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作者：
M. Loeffler;R. Baragiola
本文介绍了在80 K下用20 keV质子辐照H（2）O（2）晶体的辐射化学、溅射和非晶化的实验室研究。我们使用红外光谱来鉴定H（2）O，O（3），可能还有HO（3），测量结晶和非晶H（2）O（2）的分数以及H（2）O的产生和H（2）O（2）的破坏的能量密度依赖性。此外，使用补充技术，我们观察到溅射产额取决于由于O（2）辐射产物在样品中的积累的注量。此外，我们发现，过氧化氢的破坏和水的生产的有效截面是非常高的辐射化学过程相比，即使在水中的非晶化的注量依赖性是几乎相同的两种材料。这一结果是一致的模型的快速冷却的液体轨道所产生的每一个射弹离子，而不是与形成的辐解产物所产生的障碍。
We present laboratory studies on radiation chemistry, sputtering, and amorphization of crystalline H(2)O(2) induced by 20 keV protons at 80 K. We used infrared spectroscopy to identify H(2)O, O(3), and possibly HO(3), measure the fluence dependence of the fraction of crystalline and amorphous H(2)O(2) and of the production of H(2)O and destruction of H(2)O(2). Furthermore, using complementary techniques, we observe that the sputtering yield depends on fluence due to the buildup of O(2) radiation products in the sample. In addition, we find that the effective cross sections for the destruction of hydrogen peroxide and the production of water are very high compared to radiation chemical processes in water even though the fluence dependence of amorphization is nearly the same for the two materials. This result is consistent with a model of fast cooling of a liquid track produced by each projectile ion rather than with the disorder produced by the formation of radiolytic products.