In Situ TEM Observation of Helium Bubbles Collapsing on Nanostructured Tungsten during Annealing
In Situ TEM Observation of Helium Bubbles Collapsing on Nanostructured Tungsten during Annealing
复制标题
退火过程中纳米结构钨上氦气泡破裂的原位 TEM 观察
DOI:
10.1585/pfr.11.1206125
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发表时间:
2016
影响因子:
0.8
通讯作者:
N. Ohno
中科院分区:
文献类型:
--
作者:
M. Yajima;N. Yoshida;S. Kajita;N. Ohno
It is known that strong morphology and property changes, such as the formation of helium (He) bubbles [1–3] and fuzzy fiberform nanostructures [4, 5] (hereafter referred to as “nanostructures”), occur when tungsten (W) surfaces are irradiated by He plasma. Studies have revealed that nanostructures are formed when the temperature is in the range of 1000 2000 K and the incident ion energy is higher than 20 eV [6]. These nanostructures reintegrate onto the surface of W when heated above ∼1000 K without He-ion irradiation [7–12]. In a study, annealed samples subjected to heating in stages were observed using transmission electron microscopy (TEM), and it was found that the recovery of the nanostructures occurred at 1173 K during the surface diffusion of W [13]. However, the behavior of He bubbles during annealing and their relation to collapsing of the nanostructures are yet to be identified. In this study, we investigate the behavior of He bubbles during the annealing process using a special TEM device that enables observations to be made while the sample is being heated. Our study is the first to capture the moment when a He bubble bursts during annealing. Moreover, unlike previous studies [13], our nanostructures are coated by carbon during annealing. This simulates the effect of depositions, which can occur during an actual annealing processes, on the nanostructures. The influence of coating will be discussed later. Mechanically polished powder metallurgy W disks (Nilaco Co., Ltd.) with a diameter of 5 mm and a thickness of 0.2 mm were used as samples. The polished samples were irradiated with He plasma in the linear divertor plasma simulator NAGDIS (NAGoya DIvertor Simulator)II [14]. The incident ion energy was controlled by biasing the sample, and it was approximately 55 eV. The sample was exposed to He plasma at 1330 K up to 2.0 × 1025 m−2.
影响因子:
3.1
作者:
Nishijima, D;Ye, MY;Takamura, S
通讯作者:
Takamura, S
影响因子:
3.3
作者:
Kajita, Shin;Sakaguchi, Wataru;Saeki, Tsubasa
通讯作者:
Saeki, Tsubasa