Exploiting quantum parallelism of entanglement for a complete experimental quantum characterization of a single-qubit device
Exploiting quantum parallelism of entanglement for a complete experimental quantum characterization of a single-qubit device
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DOI：
10.1103/physreva.67.062307
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发表时间：
2002-10
影响因子：
2.9
通讯作者：
F. Martini;A. Mazzei;M. Ricci;G. D’Ariano
中科院分区：
文献类型：
--
作者：
F. Martini;A. Mazzei;M. Ricci;G. D’Ariano
我们提出了具有单一纠缠输入状态的单量子位器件的完整实验量子层析表征。在被测器件上，纠缠态在量子并行中起着所有可能输入态的作用。该方法可以简单地扩展到任何n量子位设备，只需复制整个实验设置n次。
We present the full experimental quantum tomographic characterization of a single-qubit device achieved with a single entangled input state. The entangled input state plays the role of all possible input states in quantum parallel on the tested device. The method can be trivially extended to any n-qubit device by just replicating the whole experimental setup n times.