Scanning electron microscopy with spin polarized electrons (invited) (abstract)
Scanning electron microscopy with spin polarized electrons (invited) (abstract)
复制标题
自旋极化电子扫描电子显微镜（特邀）（摘要）
DOI：
10.1063/1.338454
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发表时间：
1987
影响因子：
3.2
通讯作者：
D. Pierce
中科院分区：
文献类型：
--
作者：
J. Unguris;G. Hembree;R. Celotta;D. Pierce
近年来，扫描电子显微镜和电子自旋极化分析的结合极大地提高了研究磁性微结构的能力。1，2通过测量二次电子的自旋极化，扫描电子显微镜和极化分析（SEMPA）可以直接测量入射电子束探测区域的磁化强度和方向以及磁化强度的方向。该区域由入射电子束的直径（约10 nm）和次级电子束的逃逸深度（约50 nm）限定。除了纯磁图像外，SEMPA还同时独立测量通常的地形图像，从而使磁结构和地形结构之间的比较更容易。我们已经成功地使用SEMPA研究磁性结构的铁晶体，坡莫合金薄膜，CoNi记录介质，和metglasses。从这项工作的例子将给出，以证明SEMPA的独特能力。
The recent joining of scanning electron microscopy and electron spin polarization analysis has greatly improved the ability to study magnetic microstructure.1,2 By measuring the spin polarization of secondary electrons, scanning electron microscopy with polarization analysis (SEMPA) can directly measure the magnitude and direction of the magnetization and direction of the magnetization in the region probed by the incident electron beam. This region is defined by the diameter of the incident electron beam (∼10 nm) and the escape depth of the secondaries (∼5 nm). In addition to the purely magnetic image SEMPA also simultaneously and independently measures the usual topographic image, thereby making comparisons between magnetic and topographic structures easier. We have successfully used SEMPA to study magnetic structures in Fe crystals, permalloy films, CoNi recording media, and metglasses. Examples from this work will be given in order to demonstrate the unique capabilities of SEMPA.