Low-threshold InP quantum dot and InGaP quantum well visible lasers on silicon (001)
Low-threshold InP quantum dot and InGaP quantum well visible lasers on silicon (001)
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DOI:
10.1364/optica.443979
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发表时间:
2021-11-20
期刊:
影响因子:
10.4
通讯作者:
Lee, Minjoo Larry
中科院分区:
文献类型:
--
作者:
Dhingra, Pankul;Su, Patrick;Lee, Minjoo Larry
Monolithically combining silicon nitride (SiNx) photonics technology with III-V active devices could open a broad range of on-chip applications spanning a wide wavelength range of similar to 400-4000 nm. With the development of nitride, arsenide, and antimonide lasers based on quantum well (QW) and quantum dot (QD) active regions, the wavelength palette of integrated III-V lasers on Si currently spans 400 nm to 11 mu m, with a crucial gap in the red-wavelength regime of 630-750 nm. Here, we demonstrate red In0.6Ga0.4 PQW and far-red In PQD lasers monolithically grown on CMOS-compatible Si (001) substrates with continuous-wave operation at room temperature. A low-threshold current density of 550 A/cm(2) and 690 A/cm(2) with emission at 680-730 nm was achieved for QW and QD lasers on Si, respectively. This work represents a step toward the integration of visible red lasers on Si, allowing the utilization of integrated photonics for applications including biophotonic sensing, quantum computing, and near-eye displays. (C) 2021 Optica Publishing Group under the terms of the Optica Open Access Publishing Agreement