Measuring electro-optic coefficients of poled polymers using fiber-optic Mach-Zehnder interferometer
Measuring electro-optic coefficients of poled polymers using fiber-optic Mach-Zehnder interferometer
复制标题
DOI：
10.1063/1.1826221
复制
发表时间：
2004-11
影响因子：
4
通讯作者：
Yiping Wang;Jianping Chen;Xinwan Li;Jian-xun Hong;Xiao-Hong Zhang;Junhe Zhou;A. Ye
中科院分区：
文献类型：
--
作者：
Yiping Wang;Jianping Chen;Xinwan Li;Jian-xun Hong;Xiao-Hong Zhang;Junhe Zhou;A. Ye
提出并论证了光纤马赫-曾德尔干涉仪不仅可以精确测量极化聚合物薄膜的电光系数，而且可以测量极化聚合物波导的电光系数。此外，还可以同时测量电光系数的张量分量r13和r33。
It is proposed and demonstrated that fiber-optic Mach–Zehnder interferometer measures accurately electro-optic coefficients of, not only poled polymer thin films, but also poled polymer waveguides. Furthermore, the tensor components, both r13 and r33, of electro-optic coefficient can be measured simultaneously.