Registration of the Novel Wheat Lines L658, L693, L696, and L699, with Resistance to Fusarium Head Blight, Stripe Rust, and Powdery Mildew
Registration of the Novel Wheat Lines L658, L693, L696, and L699, with Resistance to Fusarium Head Blight, Stripe Rust, and Powdery Mildew
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DOI：
10.3198/jpr2014.01.0003crg
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发表时间：
2015-01-01
影响因子：
0.8
通讯作者：
Luo, Peigao
中科院分区：
文献类型：
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作者：
Liu, Zhaohui;Xu, Meng;Luo, Peigao
四种红色春小麦（Triticum aestivum L.）系，L658 （Reg.）。否。GP-971, PI 672537), L693 (Reg；否。GP-972, PI 672538), L696 (Reg；否。GP-973, PI 672539)和L699 (Reg。否。GP-974, PI 672540)系中国四川农业大学植物育种与遗传省重点实验室以普通小麦（Triticum aestivum, 2n = 6x = 42， AABBDD）与Thinopyrum intermedium (Host) Barkworth & D.R. Dewey (2n = 6x = 42； JJJ（s)J(s)SS）杂交的杂交品种MY11 /YU25为基础培育而成。根据3个不同年份在3个不同地区进行的试验结果，这4个小麦品系对赤霉病（FHB）的抗性水平与抗赤霉病基因型“苏麦3号”和“王水白”相似。除了抗FHB外，这些品系对条纹锈病（由锈菌引起）也有很强的抵抗力。f. sp. tritici)，感染型(IT) = 0或0；白粉病（由小麦赤霉病（Erysiphe graminis f.sp . tritici）引起），IT = 0。在中国河南省获得的结果也表明，这些品系具有适宜的农艺和形态性状。上述结果表明，L658、L693、L696和L699在小麦抗赤霉病、条锈病和白粉病的遗传改良中具有重要作用。
Four red spring wheat (Triticum aestivum L.) lines, L658 (Reg. No. GP-971, PI 672537), L693 (Reg. No. GP-972, PI 672538), L696 (Reg. No. GP-973, PI 672539), and L699 (Reg. No. GP-974, PI 672540), were developed at the Provincial Key Laboratory of Plant Breeding and Genetics, Sichuan Agricultural University of China from the cross 'MY11'/YU25, the latter of which was derived from a cross between common wheat (Triticum aestivum, 2n = 6x = 42, AABBDD) and Thinopyrum intermedium (Host) Barkworth & D.R. Dewey (2n = 6x = 42; JJJ(s)J(s)SS). The four wheat lines have high levels of resistance to Fusarium head blight (FHB) (mainly caused by Fusarium graminearum Schwabe) similar to those of the FHB-resistant genotypes 'Sumai 3' and 'Wangshuibai' based on results of experiments conducted in three different years in three different areas. In addition to FHB resistance, these lines also have strong resistance to both stripe rust (caused by Puccinia striiformis Westend. f. sp. tritici), with infection type (IT) = 0 or 0;, and powdery mildew (caused by Erysiphe graminis f. sp. tritici), with IT = 0. The results obtained in the Henan Province of China also show that these lines have suitable agronomic and morphological traits. These results indicate that the novel resistant wheat lines L658, L693, L696, and L699 could play an important role in wheat genetic improvement, especially for FHB, stripe rust, and powdery mildew resistance.