Spectroscopy of Hard X-Rays (2–15 keV) Generated by Focusing Femtosecond Laser on Metal Targets
Spectroscopy of Hard X-Rays (2–15 keV) Generated by Focusing Femtosecond Laser on Metal Targets
复制标题
将飞秒激光聚焦在金属目标上产生的硬 X 射线 (2–15 keV) 的光谱
DOI：
10.1143/jjap.38.6754
复制
发表时间：
1999
影响因子：
1.5
通讯作者：
H. Tsunemi
中科院分区：
文献类型：
--
作者：
Y. Fujimoto;Y. Hironaka;K. Nakamura;K. Kondo;Masatake Yoshida;M. Ohtani;H. Tsunemi
利用直接探测电荷耦合装置，在2~15keV的能量范围内，对飞秒激光(42fs，780 nm)聚焦于由不同原子序数(Z)元素组成的金属靶产生的硬X射线进行了光谱测量。从中等Z靶(钛、铁、镍、铜和锌)产生的X射线观察到了尖锐的K壳线发射，这可以用于X射线衍射而不需要进一步的单色化。从高Z靶(Mo、Nb和W)的X射线观察到宽的连续谱和微弱的L壳线发射。特征X射线的能量与来自中性原子或轻微电离离子的X射线的能量非常一致。
Spectroscopy of hard X-rays generated by focusing a femtosecond laser (42 fs at 780 nm) onto metal targets consisting elements of various atomic number (Z) is carried out in the energy range between 2 and 15 keV using a direct-detection charge-coupled-device camera.Sharp K-shell line emissions are observed for X-rays generated from medium-Z targets (Ti, Fe, Ni, Cu and Zn), which can be used for X-ray diffraction without further monochromization. A broad continuum and a weak trace of L-shell line emissions are observed for X-rays from high-Z targets (Mo, Nb and W). The energies of the characteristic X-rays agree well with that of X-rays from neutral atoms or slightly ionized ions.