Statistical fault analysis for a lightweight cipher midori
Statistical fault analysis for a lightweight cipher midori
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DOI：
10.1109/icinfa.2017.8078912
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发表时间：
2017-07
期刊：
影响因子：
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通讯作者：
Y. Nozaki;M. Yoshikawa
中科院分区：
文献类型：
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作者：
Y. Nozaki;M. Yoshikawa
物联网（IoT）设备的安全性非常重要。这些物联网设备的限制包括区域，电源和处理时间。因此，可以通过低面积，低功率和低潜伏期来利用的轻质密码引起了人们的注意。 Midori是最受欢迎的轻量级密码之一，它设计为定向的低功率。关于硬件安全性，指出故障分析的风险。在物联网安全的角度，对轻量密码Midori的故障分析研究非常重要。因此，本研究提出了一种新的故障分析方法，用于轻巧的密码Midori。所提出的方法执行了两个阶段故障分析，以分析Midori的所有秘密键。实验证明了所提出的方法的有效性以及Midori对断层分析的脆弱性。
The security of internet of things (IoT) device is very important. These IoT devices have constraints include area, power, and processing time. Therefore, lightweight ciphers, which can be utilized by low area, low power, and low latency, have been attracted attention. Midori is one of the most popular lightweight ciphers and it is designed oriented low power. Regarding hardware security, the risk of fault analysis is pointed out. The research of fault analysis for a lightweight cipher Midori is very important in the viewpoint of IoT security. Therefore, this study proposes a new fault analysis method for a lightweight cipher Midori. The proposed method performs two stages fault analysis to analyze all secret keys of Midori. Experiments prove the validity of the proposed method and the vulnerability of Midori against fault analysis.