Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience by Jian Min Zuo and John C.H. Spence
Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience by Jian Min Zuo and John C.H. Spence
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DOI：
10.1007/978-1-4939-6607-3
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发表时间：
2016-10
期刊：
影响因子：
5
通讯作者：
J. Zuo;J. Spence
中科院分区：
文献类型：
--
作者：
J. Zuo;J. Spence
这本书是写和组织围绕三个主题：电子衍射，电子光学和电子晶体学。它的目的是作为一个先进的本科生或研究生水平的文本，在材料科学，物理，或化学部门的课程材料的支持。高分辨率透射电子显微镜成像和扫描透射电子显微镜被视为电子光学的主要应用，以及用于结构测定的强大电子晶体学技术。重点介绍了电子衍射和电子成像在材料研究中的基本原理和应用，特别是在纳米科学研究中的应用。为此，我们已经包括了电子波传播，电子衍射和成像理论，电子光学，像差校正和仪器技术的详细处理，在材料科学或物理学研究生可以遵循的水平。对于晶体学，我们强调了对称性，结构和键合，漫散射，缺陷成像，应变测量和纳米结构的测定的基本原理。大晶体的结构测定，包括聚合物和生物样品，在这本书中没有专门讨论，虽然电子衍射和成像理论在这里提出和仪器技术同样适用于这些主题。透射电子显微镜（TEM）传统上是指电子衍射和成像技术，是由透射电子显微镜（具有相同的TEM首字母缩写）启用。扫描透射电子显微镜（STEM）体现了一套单独的技术。作为TEM和STEM的现代TEM的发展将它们结合在一起，作为互补技术，通常缩写为S/TEM。出于这个原因，我们只是在书名中使用TEM。与TEM相比，STEM与强大的分析技术相关，例如电子能量损失光谱和能量色散X射线光谱。TEM的这一方面在这里没有涉及，读者可以参考Egerton（2011），Hawkes and Spence（2007）以及Pennycook and Nellist（2011）关于这些主题的优秀书籍。
This book is written and organized around three topics: electron diffraction, electron optics, and electron crystallography. It is intended as an advanced undergraduateor graduate-level text in support of course materials in materials science, physics, or chemistry departments. High-resolution transmission electron microscope imaging and scanning transmission electron microscopy are treated as major applications of electron optics, as well as powerful electron crystallographic techniques for structure determination. The emphasis here is on the fundamentals and applications of electron diffraction and imaging in materials research, especially in the study of nanoscience. For this purpose, we have included theory for electron wave propagation, electron diffraction and imaging, and a detailed treatment of electron optics, aberration correction, and instrument techniques, on a level that can be followed by a materials science or physics graduate student. For crystallography, we have emphasized the fundamentals of symmetry, structure and bonding, diffuse scattering, imaging of defects, strain measurement, and determination of nanostructures. Structure determination of large crystals, including polymeric and biological samples, is not discussed specifically in this book, although the electron diffraction and imaging theories presented here and instrumental techniques apply equally to these topics.Transmission electron microscopy (TEM) traditionally refers to electron diffraction and imaging techniques that are enabled by a transmission electron microscope (with the same TEM acronym). Scanning transmission electron microscopy (STEM) embodies a separate set of techniques. The development of modern TEMs that function as both TEM and STEM has brought them together, as complementary techniques, often abbreviated as S/TEM. For this reason, we have simply used TEM in the book’s title. STEM, more than TEM, is associated with powerful analytical techniques, such as electron energy loss spectroscopy and energy-dispersive X-ray spectroscopy. This aspect of TEM is not covered here, and readers are referred to the excellent books on these subjects by Egerton (2011), Hawkes and Spence (2007), and Pennycook and Nellist (2011).