A Single-Tilt TEM Stereomicroscopy Technique for Crystalline Materials
A Single-Tilt TEM Stereomicroscopy Technique for Crystalline Materials
复制标题
晶体材料的单倾斜 TEM 体视显微镜技术
DOI：
10.1017/s1431927603030071
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发表时间：
2003
影响因子：
2.8
通讯作者：
K. B. Alexander
中科院分区：
文献类型：
--
作者：
R. Mccabe;A. Misra;T. Mitchell;K. B. Alexander
开发了一种新的单倾斜技术，用于对晶体材料中的应变场进行 TEM 立体显微镜检查。该技术是一种弱光束技术，涉及在倾斜穿过一组菊池带时改变 g 和/或 sg 的值。该技术的主要优点是它可以与单倾斜 TEM 样品架一起使用，包括许多专用样品架，例如原位应变、加热和冷却样品架。标准立体 TEM 技术几乎总是限于允许两个旋转自由度的支架（即双倾斜或倾斜/旋转支架）。新技术的另一个好处是，它无需通过样品高度控制进行聚焦。这些优点使其可用于立体观察或定量立体显微镜，前提是对该技术可能导致的误差给予必要的考虑。
A new single-tilt technique for performing TEM stereomicroscopy of strain fields in crystalline materials has been developed. The technique is a weak beam technique that involves changing the value of g and/or sg while tilting across a set of Kikuchi bands. The primary benefit of the technique is it can be used with single-tilt TEM specimen holders including many specialty holders such as in situ straining, heating, and cooling holders. Standard stereo-TEM techniques are almost always limited to holders allowing two degrees of rotational freedom (i.e., double-tilt or tilt/rotation holders). An additional benefit of the new technique is that it eliminates the need to focus with the specimen height control. These advantages make it useful for stereo viewing or for quantitative stereomicroscopy provided necessary consideration is given to errors that may result from the technique.