X-ray diffraction from levitated liquids
X-ray diffraction from levitated liquids
复制标题
悬浮液体的 X 射线衍射
DOI：
10.1088/0953-8984/12/12/201
复制
发表时间：
2000
期刊：
影响因子：
--
通讯作者：
D. Price
中科院分区：
文献类型：
--
作者：
S. Krishnan;D. Price
无容器技术能够获得非常高的液体温度，保持样品纯度，控制样品化学和进入过冷状态，这为研究具有非常高控制度的高温液体创造了新的机会。最近，这些已结合X射线衍射在同步辐射源，以提供结构信息，以前没有。本文回顾和总结了最近的结果，从x射线衍射悬浮液体材料在正常和过冷状态。特别是，它解决了过冷对短程结构的影响，包括原子间的距离和协调，几个高温熔融氧化物，半导体和金属材料。这些液体的性质进行了讨论的背景下，可用的分子动力学模拟和热物理性质的数据。
The ability of containerless techniques to access very high liquid temperatures, maintain specimen purity, enable control of specimen chemistry and access the supercooled state has created new opportunities to study high-temperature liquids with a very high degree of control. Recently, these have been combined with x-ray diffraction at synchrotron sources to provide structural information not previously available. This article reviews and summarizes recent results obtained from x-ray diffraction on levitated liquid materials in both the normal and supercooled states. In particular, it addresses the effects of supercooling on the short-range structure, including interatomic distances and coordinations, of several high-temperature molten oxides, semiconductors and metallic materials. The properties of these liquids are discussed in the context of available molecular dynamics simulations and thermophysical property data.