RESOLUTION EFFECTS AND ANALYSIS OF SMALL-ANGLE NEUTRON-SCATTERING DATA
RESOLUTION EFFECTS AND ANALYSIS OF SMALL-ANGLE NEUTRON-SCATTERING DATA
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DOI：
10.1051/jp4:19938102
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发表时间：
1993-12-01
期刊：
影响因子：
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通讯作者：
PEDERSEN, JS
中科院分区：
文献类型：
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作者：
PEDERSEN, JS
讨论了小角中子散射（SANS）数据的仪器拖尾效应。结果表明，这些影响可以描述的分辨率函数，它描述了散射矢量的标称值探测的散射矢量的分布。分辨率函数与样品的散射截面无关，并且可以针对任何仪器设置一次性计算。对于各向同性系统的散射，分辨率函数允许仅通过计算一个数值积分来计算拖尾强度。它讨论了如何解析地计算分辨率函数。通过蒙特卡罗模拟确定并测量。它表明，对于典型的SANS设置，分辨率函数可以描述一个高斯函数的一个很好的近似。将在计算机程序中的功能最小二乘拟合已知的横截面和间接傅立叶变换进行了讨论。最后给出了一些应用实例。
A discussion of the instrumental smearing effects for small-angle neutron scattering (SANS) data sets is given. It is shown that these effects can be described by a resolution function, which describes the distribution of scattering vectors probed for the nominal values of the scattering vector. The resolution function is independent of the scattering cross section of the sample and can be calculated once and for all for any instrumental setting. For scattering from isotropic system the resolution function allows the smeared intensity to be calculated by computing only one numerical integral. It is discussed how the resolution function can be calculated analytically. determined by Monte Carlo simulations, and measured. It is demonstrated that for typical SANS setups, the resolution function can be described by a Gaussian function to a good approximation. The incorporation of the function in computer programs for least-squares fits of known cross sections and for indirect Fourier transformations is discussed. Finally, some examples are given which demonstrate the application.