Is phase-mask alignment aberrating your STED microscope?
Is phase-mask alignment aberrating your STED microscope?
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DOI：
10.1088/2050-6120/3/2/024002
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发表时间：
2015-06-01
影响因子：
3.2
通讯作者：
Booth, Martin J.
中科院分区：
文献类型：
--
作者：
Patton, Brian R.;Burke, Daniel;Booth, Martin J.
受激发射耗尽（STED）显微镜的性能关键取决于用于形成耗尽焦点的光瞳平面相位掩模。掩模的未对准产生损耗焦点的不希望的失真，从而损害图像质量。它示出了如何引入一个错位的掩模的相位误差是类似于慧形像差。通过数值模拟和实验测量，分析研究的影响。的掩模的系统对准的策略进行了讨论。
The performance of a stimulated emission depletion (STED) microscope depends critically upon the pupil plane phase mask that is used to shape the depletion focus. Misalignments of the mask create unwanted distortions of the depletion focus to the detriment of image quality. It is shown how the phase errors introduced by a misplaced mask are similar to coma aberrations. The effects are investigated analytically, through numerical modelling and experimental measurement. Strategies for the systematic alignment of the masks are discussed.