Exchange coupling in NiFe/NiMn films studied by pseudo-Hall effect
Exchange coupling in NiFe/NiMn films studied by pseudo-Hall effect
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DOI：
10.1063/1.1289036
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发表时间：
2000-08
影响因子：
4
通讯作者：
Guohong Li;Tao Yang;Q. Hu;W. Lai
中科院分区：
文献类型：
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作者：
Guohong Li;Tao Yang;Q. Hu;W. Lai
在旋转磁场中测量了交换偏置NiFe/NiMn薄膜中的赝霍尔效应。除了准确地确定交换偏置方向外，这些测量还可以区分NiFe层的相干旋转和非相干磁化反转。详细的磁各向异性分析表明，该系统不存在界面耦合引起的附加单轴各向异性，而反铁磁颗粒的不稳定性可能是造成可逆和不可逆测量得到的交换偏置场差异的重要原因。
Pseudo-Hall effect in exchange biased NiFe/NiMn films was measured in magnetic fields rotated in the film plane. Besides accurate determination of the exchange biasing direction, coherent rotation and incoherent reversal of the magnetization of the NiFe layers can be distinguished from these measurements. Detailed magnetic anisotropy analysis shows that there is no additional uniaxial anisotropy induced by the interfacial coupling in this system, while the instability of antiferromagnetic grains may play an important role that is responsible for the difference between exchange biasing fields obtained by reversible and irreversible measurements.