An ASIC for the Study of Charge Sharing Effects in Small Pixel CdZnTe X-Ray Detectors
An ASIC for the Study of Charge Sharing Effects in Small Pixel CdZnTe X-Ray Detectors
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DOI：
10.1109/tns.2011.2162746
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发表时间：
2011-08
影响因子：
1.8
通讯作者：
M. Veale;S. Bell;L. Jones;P. Seller;M. Wilson;C. Allwork;D. Kitou;P. Sellin;P. Veeramani;R. Cernik
中科院分区：
文献类型：
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作者：
M. Veale;S. Bell;L. Jones;P. Seller;M. Wilson;C. Allwork;D. Kitou;P. Sellin;P. Veeramani;R. Cernik
卢瑟福阿普尔顿实验室（RAL）开发了一种专用集成电路（ASIC），用于研究光谱CdTe和CdZnTe探测器中的小像素效应。PIXIE ASIC由四个3 × 3通道倒装芯片阵列直接连接到检测器像素。每个通道的有源电路是一个电荷敏感前置放大器和一个直接在芯片外复用的输出缓冲器。四个探测器阵列中的每一个都有不同的阳极几何形状。RAL开发的HEXITEC系列小像素探测器已经证明CdTe和CdZnTe的能量分辨率为每像素1 keV，然而，电荷共享事件占总计数率的30-40%，如果不进行校正，可能导致光谱退化。PIXIE ASIC将用于研究阳极几何形状对电荷共享的影响以及小像素效应的其他方面。
An Application Specific Integrated Circuit (ASIC) has been developed at the Rutherford Appleton Laboratory (RAL) to study the small pixel effect in spectroscopic CdTe and CdZnTe detectors. The PIXIE ASIC consists of four arrays of 3 × 3 channels flip chip bonded directly to the detector pixels. The active circuitry of each channel is a charge sensitive preamplifier and an output buffer which is multiplexed directly off chip. Each of the four detector arrays has a different anode geometry. The HEXITEC series of small pixel detectors developed at RAL have demonstrated energy resolutions of ~1 keV per pixel for both CdTe and CdZnTe, however, charge sharing events account for between 30-40% of the total count rate and can lead to degradation of the spectroscopy if not corrected for. The PIXIE ASIC will be used to study the effect of anode geometry on charge sharing and other aspects of the small pixel effect.