Modified interfacial reactions in Ag-Zn multilayers under the influence of high DC currents

Modified interfacial reactions in Ag-Zn multilayers under the influence of high DC currents
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DOI:
10.1016/j.intermet.2004.02.005
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发表时间:
2004-06-01
期刊:
影响因子:
4.4
通讯作者:
Munir, ZA
Munir, ZA
中科院分区:
材料科学2区
文献类型:
--
作者:
Friedman, JR;Garay, JE;Munir, ZA

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在300 ℃和350 ℃之间的温度下,研究了高达764 A/cm(2)的直流电流对银-锌扩散偶界面反应的影响。无论电流密度如何,产物总是含有三种金属间化合物:AgZn、Ag 5 Zn 8和AgZn 3。每种化合物的相对丰度不受电流的影响。AgZn相占主导地位,其次是Ag 5 Zn 8和AgZn 3相。然而,施加的直流电流,被发现强烈增强的所有阶段的生长动力学阈值以上。阈值电流随反应温度的升高而增大。所有相的生长的增加不受电流方向的影响,这意味着电迁移不是增强生长的主要原因。有人建议,一个可能的电流效应是在缺陷浓度或原子迁移率的增加。(C)2004爱思唯尔有限公司保留所有权利。
The influence of DC currents of up to 764 A/cm(2) on interfacial reactions in silver-zinc diffusion couples was investigated at temperatures between 300 and 350 degreesC. Regardless of current density, the product always contained three intermetallic compounds: AgZn, Ag5Zn8, and AgZn3. The relative abundance of each of the compounds was unaffected by the current. The AgZn phase was dominant, followed by the Ag5Zn8 and AgZn3 phases. The imposition of a DC current, however, was found to strongly enhance the growth kinetics of all phases above a threshold value. The threshold current increases with increased reaction temperature. The increase in growth of all phases was unaffected by the direction of the current, implying that electromigration was not a dominant cause of the enhanced growth. It is suggested that a possible current effect is an increase in defect concentration or atomic mobility. (C) 2004 Elsevier Ltd. All rights reserved.