Significantly improved lifetime of micro-channel plate PMTs
Significantly improved lifetime of micro-channel plate PMTs
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显着提高微通道板 PMT 的使用寿命
DOI：
10.1016/j.nima.2012.11.109
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发表时间：
2013
影响因子：
1.4
通讯作者：
F. Uhlig
中科院分区：
文献类型：
--
作者：
A. Lehmann;A. Britting;W. Eyrich;C. Schwarz;J. Schwiening;F. Uhlig
BINP, Hamamatsu （R10754X）和PHOTONIS （XP85112）的最新一代微通道板（MCP） pmt的寿命正在同时测量中进行研究。我们发现，采用新技术来减少mcp - pmt光电阴极的老化，显著提高了其寿命。暗计数率、增益和量子效率随阳极电荷的变化而变化。在光电阴极表面测量了几次量子效率。在目前正在进行的测量中，最好的MCP- pmt是XP85112，其MCP表面涂有原子层，以减少铅玻璃的脱气。该管在2.1C/cm2的综合阳极充电后没有老化，比上一代mcp - pmt好一个数量级以上。
The lifetime of the most recent generation micro-channel plate (MCP) PMTs of BINP, Hamamatsu (R10754X) and PHOTONIS (XP85112) is being studied in a simultaneous measurement. We find that the new techniques applied to reduce the aging of the photocathode of the MCP-PMTs has significantly increased the lifetime. Dark count rate, gain and quantum efficiency of the tubes are given as a function of the integrated anode charge. Several times the quantum efficiency was also measured across the surface of the photocathode. At this point of the ongoing measurements the best MCP-PMT turns out to be the XP85112 with its MCP surfaces coated by an atomic layer to reduce the outgassing of the lead glass. This tube shows no aging after an integrated anode charge of 2.1C/cm2which is more than an order of magnitude better than that of previous generation MCP-PMTs.
DOI：
10.1016/j.nima.2008.07.083
发表时间：
2008-09-21
影响因子：
1.4
作者：
Lehmann, A.;Britting, A.;Sfienti, C.
通讯作者：
Sfienti, C.