The influence of aberrations in third harmonic generation microscopy
The influence of aberrations in third harmonic generation microscopy
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DOI：
10.1088/2040-8978/12/8/084009
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发表时间：
2010-08
影响因子：
2.1
通讯作者：
A. Thayil;A. Jesacher;T. Wilson;M. Booth
中科院分区：
文献类型：
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作者：
A. Thayil;A. Jesacher;T. Wilson;M. Booth
我们提出了一个分析的三次谐波产生（THG）显微镜的像差的影响，考虑不同的样品的几何形状。数值模拟表明，信号强度和分辨率降低的一般趋势，像差的幅度增加。它还表明，有一定的组合的标本结构和聚焦位置的存在下的像差的结果在图像强度的增加。例如，当焦点体积附近存在多个界面时，会发生这种情况。激发聚焦体积的轴向扩展增加了THG信号建立的特征相干长度，导致对来自焦平面附近的轴向平面的图像亮度的显著贡献。这些结果具有重要的后果的解释的三倍频显微镜图像和基于图像的自适应光学三倍频显微镜像差校正。
We present an analysis of the effects of aberrations in third harmonic generation (THG) microscopy by considering different specimen geometries. Numerical simulations show the general trend that signal intensity and resolution are reduced as aberrations increase in amplitude. It is also shown that there are certain combinations of specimen structure and focusing position for which the presence of aberrations results in an increase in the image intensity. This occurs, for example, when there are several interfaces near the focal volume. The axial spreading of the excitation focal volume increases the characteristic coherence length for THG signal build-up, resulting in a significant contribution to the image brightness from axial planes near the focal plane. These results have important consequences for the interpretation of THG microscope images and for image based aberration correction in adaptive optics THG microscopy.