Matching planar maps
Matching planar maps
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DOI：
10.1016/s0196-6774(03)00085-3
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发表时间：
2003-11-01
影响因子：
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通讯作者：
Wenk, C
中科院分区：
文献类型：
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作者：
Alt, H;Efrat, A;Wenk, C
The subject of this paper are algorithms for measuring the similarity of patterns of line segments in the plane, a standard problem in, e.g., computer vision, geographic information systems, etc. More precisely, we define feasible distance measures that reflect how close a given pattern H is to some part of a larger pattern G. These distance measures are generalizations of the well-known Frechet distance for curves. We first give an efficient algorithm for the case that H is a polygonal curve and G is a geometric graph. Then, slightly relaxing the definition of distance measure, we give an algorithm for the general case where both, H and G, are geometric graphs. (C) 2003 Elsevier Inc. All rights reserved.
