Using item-specific instructional information in achievement modeling
Using item-specific instructional information in achievement modeling
复制标题
在成就建模中使用特定于项目的指导信息
DOI:
10.1007/bf02294624
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发表时间:
1989
期刊:
影响因子:
3
通讯作者:
B. Muthén
中科院分区:
文献类型:
--
作者:
B. Muthén
The problem of detecting instructional sensitivity (“item basis”) in test items is considered. An illustration is given which shows that for tests with many biased items, traditional item bias detection schemes give a very poor assessment of bias. A new method is proposed instead. This method extends item response theory (IRT) by including item-specific auxiliary measurement information related to opportunity-to-learn. Item-specific variation in measurement relations across students with varying opportunity-to-learn is allowed for.