Characterization of the Interfaces in LiFePO4/PEO-LiTFSI Composite Cathodes and to the Adjacent Layers

Characterization of the Interfaces in LiFePO4/PEO-LiTFSI Composite Cathodes and to the Adjacent Layers
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LiFePO4/PEO-LiTFSI 复合阴极及其相邻层界面的表征

DOI:
10.1149/2.0621903jes
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发表时间:
2019
影响因子:
3.9
通讯作者:
R. Hausbrand
R. Hausbrand
中科院分区:
工程技术4区
文献类型:
--
作者:
V. Wurster;C. Engel;H. Graebe;T. Ferber;W. Jaegermann;R. Hausbrand

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电池单元不同组件之间的界面电阻限制了其快速充电和放电能力,而这是电动汽车等不同应用所需的。为了降低界面电阻,有必要了解它们出现在哪个单独的界面以及如何控制它们。电化学阻抗谱是一种成熟的技术,用于区分对内部电池电阻的不同贡献,并允许表征界面电阻。特别是使用合适的单元设置可以将测量的电阻归因于特定的接口。在本文中,我们研究了包含磷酸铁锂/聚环氧乙烷-双(三氟甲磺酰基)酰亚胺锂复合阴极、固体聚合物电解质隔膜和锂金属阳极的干聚合物全电池的阻抗。根据不同电池设置的结果,我们能够可靠地确定组件之间的平面电阻以及复合阴极内部的电荷转移电阻。对于未优化的系统,我们发现平面电阻较高,可以通过涂层和加工策略显着降低。对于电荷转移电阻,我们发现与 SOC 以及充电方向相关。还根据光电子能谱 (XPS) 进行的化学分析讨论了界面电阻演变的可能机制。
Interface resistances between the different components of battery cells limit their fast charge and discharge capability which is required for different applications such as electromobility. To decrease interface resistances, it is necessary to understand which individual interface they arise at and how they can be controlled. Electrochemical impedance spectroscopy is a well-established technique for the distinction of different contributions to the internal cell resistance and allows the characterization of interface resistances. Especially the use of suitable cell setups allows one to attribute the measured resistances to specific interfaces. In this contribution, we investigate the impedance of dry polymer full cells containing a lithium iron phosphate/poly (ethylene oxide)-lithium bis (trifluoromethanesulfonyl) imide composite cathode, a solid polymer electrolyte separator and a lithium-metal anode. Based on the results on different cell setups, we are able to reliably determine the planar resistances between the components as well as the charge transfer resistance inside the composite cathode. For unoptimized systems, we find high planar resistances, which can be significantly reduced by coating and processing strategies. For the charge transfer resistance, we find a dependence on the SOC as well as on the charging direction. Possible mechanisms for the evolution of interface resistances are discussed also based on chemical analysis performed by photoelectron spectroscopy (XPS).
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