Monte Carlo simulation studies of detectors used in the measurement of diagnostic x-ray spectra.
Monte Carlo simulation studies of detectors used in the measurement of diagnostic x-ray spectra.
复制标题
用于测量诊断 X 射线光谱的探测器的蒙特卡罗模拟研究。
DOI：
10.1118/1.594706
复制
发表时间：
1980
期刊：
影响因子：
3.8
通讯作者：
Holje,G
中科院分区：
文献类型：
--
作者：
Chen,CS;Doi,K;Vyborny,C;Chan,HP;Holje,G
准确确定诊断X射线光谱需要在许多其他技术考虑因素中，对X射线探测器的能量依赖响应的实验数据进行校正。在这项研究中，我们研究了诊断能量范围内常用的三种类型探测器（本征锗，锂漂移硅和碘化钠）的能量响应。我们使用蒙特卡罗模拟技术来计算不同探测器厚度和直径下的峰值效率、逃逸峰损失和康普顿分数随入射X射线能量的变化。计算的响应进行了比较，获得的Ge和Si（Li）探测器的实验结果。测量中，我们用荧光X射线模拟的单能光束假设的计算，表明理论和实验方法之间的良好协议。还评估了用于校正检测器的已知响应的测量光谱的技术。
Accurate determination of diagnostic x‐ray spectra requires, among many other technical considerations, correction of the experimental data for the energy‐dependent response of the x‐ray detector. In this study, we investigated the energy response of three types of detectors (intrinsic germanium, lithium‐drifted silicon, and sodium iodide) commonly used in the diagnostic energy range. We used a Monte Carlo simulation technique to compute photopeak efficiencies, escape peak losses, and Compton fractions as a function of incident x‐ray energy for a variety of detector thicknesses and diameters. Calculated responses were compared with experimental results obtained for the Ge and Si(Li) detectors. The measurements, in which we used fluorescent x ray to simulate the monoenergetic beams assumed for the calculations, indicate good agreement between theoretical and experimental approaches. Techniques for correction of measured spectra for the known response of the detector were also evaluated.