Protective properties of YSZ/Ti film deposited on CoSb3 thermoelectric material
Protective properties of YSZ/Ti film deposited on CoSb3 thermoelectric material
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CoSb3热电材料上沉积YSZ/Ti薄膜的防护性能
DOI:
10.1016/j.corsci.2015.05.011
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发表时间:
2015-09
期刊:
影响因子:
--
通讯作者:
Xinying Teng
中科院分区:
文献类型:
--
作者:
Shengqiang Bai;Qian Ma;Min Zuo;Xinying Teng
The YSZ (yttria-stabilized zirconia)/Ti film was deposited on CoSb3substrate by magnetron sputtering to suppress the sublimation of antimony in CoSb3during thermal aging test. Both YSZ and Ti film were columnar crystal. The YSZ film typically grew on Ti film in the island mode. No cracks, porosity or other defects were observed on YSZ film. The weight loss per unit area of CoSb3samples coated with YSZ/Ti film was much lower than that of uncoated CoSb3sample after accelerated thermal aging test. The results indicated that the sublimation of antimony in CoSb3was effectively suppressed by YSZ/Ti film.
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