Protective properties of YSZ/Ti film deposited on CoSb3 thermoelectric material

Protective properties of YSZ/Ti film deposited on CoSb3 thermoelectric material
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CoSb3热电材料上沉积YSZ/Ti薄膜的防护性能

DOI:
10.1016/j.corsci.2015.05.011
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发表时间:
2015-09
期刊:
Corros. Sci
影响因子:
--
通讯作者:
Xinying Teng
Xinying Teng
中科院分区:
其他
文献类型:
--
作者:
Shengqiang Bai;Qian Ma;Min Zuo;Xinying Teng

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采用磁控溅射法在CoSb 3基体上沉积YSZ(钇稳定氧化锆)/Ti薄膜,以抑制CoSb 3中Sb在热老化过程中的升华。YSZ和Ti薄膜均为柱状晶。YSZ薄膜典型地以岛状方式生长在Ti薄膜上。在YSZ薄膜上没有观察到裂纹、孔隙或其他缺陷。在加速热老化试验中,YSZ/Ti涂层的CoSb 3样品的单位面积失重率远低于未涂层的CoSb 3样品。结果表明,YSZ/Ti薄膜有效地抑制了CoSb 3中Sb的升华。
The YSZ (yttria-stabilized zirconia)/Ti film was deposited on CoSb3substrate by magnetron sputtering to suppress the sublimation of antimony in CoSb3during thermal aging test. Both YSZ and Ti film were columnar crystal. The YSZ film typically grew on Ti film in the island mode. No cracks, porosity or other defects were observed on YSZ film. The weight loss per unit area of CoSb3samples coated with YSZ/Ti film was much lower than that of uncoated CoSb3sample after accelerated thermal aging test. The results indicated that the sublimation of antimony in CoSb3was effectively suppressed by YSZ/Ti film.
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