Localization of iron in rice grain using synchrotron X-ray fluorescence microscopy and high resolution secondary ion mass spectrometry
Localization of iron in rice grain using synchrotron X-ray fluorescence microscopy and high resolution secondary ion mass spectrometry
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DOI：
10.1016/j.jcs.2013.12.006
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发表时间：
2014-03
影响因子：
3.8
通讯作者：
B. Kyriacou;K. Moore;D. Paterson;M. D. Jonge;D. Howard;J. Stangoulis;M. Tester;E. Lombi;Alexander W. Johnson
中科院分区：
文献类型：
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作者：
B. Kyriacou;K. Moore;D. Paterson;M. D. Jonge;D. Howard;J. Stangoulis;M. Tester;E. Lombi;Alexander W. Johnson
