A high-resolution electrostatic spectrometer for the investigation of near-surface layers in solids by high-resolution Rutherford backscattering with MeV ions
A high-resolution electrostatic spectrometer for the investigation of near-surface layers in solids by high-resolution Rutherford backscattering with MeV ions
复制标题
高分辨率静电光谱仪，用于通过 MeV 离子的高分辨率卢瑟福背散射研究固体中的近表面层
DOI：
10.1016/0168-583x(92)95585-f
复制
发表时间：
1992
影响因子：
1.3
通讯作者：
H. Carstanjen
中科院分区：
文献类型：
--
作者：
T. Enders;M. Rilli;H. Carstanjen
