Thermally conductive ultra-low-k dielectric layers based on two-dimensional covalent organic frameworks
Thermally conductive ultra-low-k dielectric layers based on two-dimensional covalent organic frameworks
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DOI:
10.1038/s41563-021-00934-3
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发表时间:
2021-03-18
期刊:
影响因子:
41.2
通讯作者:
Hopkins, Patrick E.
中科院分区:
文献类型:
--
作者:
Evans, Austin M.;Giri, Ashutosh;Hopkins, Patrick E.
Low-k dielectric materials are essential to allow continued electronics miniaturization, but their low thermal conductivity limits performance. Here, two-dimensional covalent organic frameworks are shown to combine high thermal conductivity with a low dielectric constant.As the features of microprocessors are miniaturized, low-dielectric-constant (low-k) materials are necessary to limit electronic crosstalk, charge build-up, and signal propagation delay. However, all known low-k dielectrics exhibit low thermal conductivities, which complicate heat dissipation in high-power-density chips. Two-dimensional (2D) covalent organic frameworks (COFs) combine immense permanent porosities, which lead to low dielectric permittivities, and periodic layered structures, which grant relatively high thermal conductivities. However, conventional synthetic routes produce 2D COFs that are unsuitable for the evaluation of these properties and integration into devices. Here, we report the fabrication of high-quality COF thin films, which enable thermoreflectance and impedance spectroscopy measurements. These measurements reveal that 2D COFs have high thermal conductivities (1 W m(-1) K-1) with ultra-low dielectric permittivities (k = 1.6). These results show that oriented, layered 2D polymers are promising next-generation dielectric layers and that these molecularly precise materials offer tunable combinations of useful properties.