Electron-beam-induced ferroelectric domain behavior in the transmission electron microscope: Toward deterministic domain patterning
Electron-beam-induced ferroelectric domain behavior in the transmission electron microscope: Toward deterministic domain patterning
复制标题
透射电子显微镜中电子束诱导的铁电畴行为：走向确定性畴图案
DOI：
10.1103/physrevb.94.174104
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发表时间：
2016
影响因子：
3.7
通讯作者：
Hart J
中科院分区：
文献类型：
--
作者：
Hart J
我们报告了透射电子显微镜束诱导铁电畴成核和运动。虽然以前的观察这种现象已经报道，一个一致的理论解释诱导域响应是缺乏的，并已被证明几乎没有控制域的行为。我们确定积极的样品充电，俄歇和二次电子发射的结果，作为驱动域行为的基本机制。通过将电子束会聚到聚焦探针，我们展示了纳米级域的受控成核。进行的分子动力学模拟与实验结果是一致的，确认积极的样品充电和再现的结果控制域成核。此外，我们讨论了样品的几何形状和电子辐照条件对诱导畴响应的影响。这些研究结果阐明了过去的报告中的电子束诱导域行为的透射电子显微镜，并提供了一个更预测性，确定性域图案通过电子辐照的路径。
We report on transmission electron microscope beam-induced ferroelectric domain nucleation and motion. While previous observations of this phenomenon have been reported, a consistent theory explaining induced domain response is lacking, and little control over domain behavior has been demonstrated. We identify positive sample charging, a result of Auger and secondary electron emission, as the underlying mechanism driving domain behavior. By converging the electron beam to a focused probe, we demonstrate controlled nucleation of nanoscale domains. Molecular dynamics simulations performed are consistent with experimental results, confirming positive sample charging and reproducing the result of controlled domain nucleation. Furthermore, we discuss the effects of sample geometry and electron irradiation conditions on induced domain response. These findings elucidate past reports of electron beam-induced domain behavior in the transmission electron microscope and provide a path towards more predictive, deterministic domain patterning through electron irradiation.