Challenges in low-cost test approach for ARM9/sup TM/ core based mixed-signal soc dragonball/sup TM/-MX1
Challenges in low-cost test approach for ARM9/sup TM/ core based mixed-signal soc dragonball/sup TM/-MX1
复制标题
基于ARM9/sup TM/核心的混合信号soc Dragonball/sup TM/-MX1的低成本测试方法的挑战
DOI：
10.1109/test.2003.1270877
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发表时间：
2003
期刊：
影响因子：
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通讯作者：
George Bao
中科院分区：
文献类型：
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作者：
George Bao
本文讨论了在开发新一代基于ARM9内核的混合信号系统芯片DragonBall m M X 1（DBMXI）的低成本测试策略时所面临的挑战。首先，我们提出了一个量身定制的成本模型来选择我们的自动测试设备（ATE）。利用该测试仪，我们开发了一种采用较慢测试时钟进行高速数字测试的方法，一种新的嵌入式PLL抖动测试方法，采用滑动增量周期和固定选通，以及一种用于嵌入式ADC和DAC的环回自测试方案。我们的最终目标是在一个非常低成本的纯数字ATE上实现所有的混合信号测试。
This paper discussed the challenges that we faced when we developed the low cost test strategies for the new generation ARM9 TM Core based mixed-signal System-on-a-Chip (SoC), DragonBall m M X 1 (DBMXI ). First of all, we presented a tailored cost model to select our Automatic Test Equipment (ATE). With this low cost tester, we developed a method for at-speed digital tests with slower tester clock, a new embedded PLL jitter test approach.with sliding delta cycle and fixed strobe, and a loop-back selftest proposal for embedded ADC and DAC. Our final target is to achieve all the mixed-signal tests on a very low cost pure digital ATE.