Limits on Fast Radio Bursts and other transient sources at 182 MHz using the Murchison Widefield Array
Limits on Fast Radio Bursts and other transient sources at 182 MHz using the Murchison Widefield Array
复制标题
使用 Murchison 宽场阵列对 182 MHz 下的快速无线电爆发和其他瞬态源进行限制
DOI:
10.1093/mnras/stw451
复制
发表时间:
2016
影响因子:
4.8
通讯作者:
C. Williams
中科院分区:
文献类型:
--
作者:
A. Rowlinson;M. Bell;T. Murphy;C. Trott;N. Hurley;S. Johnston;S. Tingay;D. Kaplan;D. Carbone;P. Hancock;L. Feng;A. Offringa;G. Bernardi;J. Bowman;F. Briggs;R. Cappallo;A. Deshpande;B. Gaensler;L. Greenhill;B. Hazelton;M. Johnston;C. Lonsdale;S. McWhirter;D. Mitchell;M. Morales;E. Morgan;D. Oberoi;S. Ord;T. Prabu;N. Shankar;K. Srivani;R. Subrahmanyan;R. Wayth;R. Webster;A. Williams;C. Williams
We present a survey for transient and variable sources, on time-scales from 28 s to ∼1 yr, using the Murchison Widefield Array (MWA) at 182 MHz. Down to a detection threshold of 0.285 Jy, no transient candidates were identified, making this the most constraining low-frequency survey to date and placing a limit on the surface density of transients of <4.1 × 10−7 deg−2 for the shortest time-scale considered. At these frequencies, emission from Fast Radio Bursts (FRBs) is expected to be detectable in the shortest time-scale images without any corrections for interstellar or intergalactic dispersion. At an FRB limiting flux density of 7980 Jy, we find a rate of <82 FRBs per sky per day for dispersion measures <700 pc cm−3. Assuming a cosmological population of standard candles, our rate limits are consistent with the FRB rates obtained by Thornton et al. if they have a flat spectral slope. Finally, we conduct an initial variability survey of sources in the field with flux densities ≳0.5 Jy and identify no sources with significant variability in their light curves. However, we note that substantial further work is required to fully characterize both the short-term and low-level variability within this field.
影响因子:
6.5
作者:
T. Coenen;J. V. Leeuwen;J. Hessels;B. Stappers;V. Kondratiev;A. Alexov;R. Breton;A. Bilous;S. Cooper;H. Falcke;H. Falcke;R. Fallows;V. Gajjar;J. Grießmeier;T. Hassall;A. Karastergiou;E. Keane;M. Kramer;M. Kuniyoshi;A. Noutsos;S. Osłowski;S. Osłowski;M. Pilia;M. Serylak;C. Schrijvers;C. Sobey;S. Veen;J. Verbiest;P. Weltevrede;S. Wijnholds;K. Zagkouris;A. V. Amesfoort;James M. Anderson;A. Asgekar;I. Avruch;M. Bell;M. Bentum;G. Bernardi;P. Best;A. Bonafede;F. Breitling;J. Broderick;M. Brüggen;H. Butcher;B. Ciardi;A. Corstanje;A. Deller;S. Duscha;J. Eislöffel;R. Fender;C. Ferrari;W. Frieswijk;M. Garrett;F. Gasperin;E. D. Geus;A. Gunst;J. Hamaker;G. Heald;M. Hoeft;A. Horst;E. Juette;G. Kuper;C. Law;C. Law;G. Mann;R. McFadden;D. McKay-Bukowski;D. McKay-Bukowski;J. McKean;H. Munk;E. Orrú;H. Paas;M. Pandey-Pommier;A. Polatidis;W. Reich;A. Renting;H. Röttgering;A. Rowlinson;A. Scaife;D. Schwarz;J. Sluman;O. Smirnov;J. Swinbank;M. Tagger;Y. Tang;C. Tasse;S. Thoudam;C. Toribio;R. Vermeulen;C. Vocks;R. V. Weeren;O. Wucknitz;P. Zarka;A. Zensus
通讯作者:
T. Coenen;J. V. Leeuwen;J. Hessels;B. Stappers;V. Kondratiev;A. Alexov;R. Breton;A. Bilous;S. Cooper;H. Falcke;H. Falcke;R. Fallows;V. Gajjar;J. Grießmeier;T. Hassall;A. Karastergiou;E. Keane;M. Kramer;M. Kuniyoshi;A. Noutsos;S. Osłowski;S. Osłowski;M. Pilia;M. Serylak;C. Schrijvers;C. Sobey;S. Veen;J. Verbiest;P. Weltevrede;S. Wijnholds;K. Zagkouris;A. V. Amesfoort;James M. Anderson;A. Asgekar;I. Avruch;M. Bell;M. Bentum;G. Bernardi;P. Best;A. Bonafede;F. Breitling;J. Broderick;M. Brüggen;H. Butcher;B. Ciardi;A. Corstanje;A. Deller;S. Duscha;J. Eislöffel;R. Fender;C. Ferrari;W. Frieswijk;M. Garrett;F. Gasperin;E. D. Geus;A. Gunst;J. Hamaker;G. Heald;M. Hoeft;A. Horst;E. Juette;G. Kuper;C. Law;C. Law;G. Mann;R. McFadden;D. McKay-Bukowski;D. McKay-Bukowski;J. McKean;H. Munk;E. Orrú;H. Paas;M. Pandey-Pommier;A. Polatidis;W. Reich;A. Renting;H. Röttgering;A. Rowlinson;A. Scaife;D. Schwarz;J. Sluman;O. Smirnov;J. Swinbank;M. Tagger;Y. Tang;C. Tasse;S. Thoudam;C. Toribio;R. Vermeulen;C. Vocks;R. V. Weeren;O. Wucknitz;P. Zarka;A. Zensus
影响因子:
6.5
作者:
van Haarlem, M. P.;Wise, M. W.;van Zwieten, J.
通讯作者:
van Zwieten, J.