Impact of Negative Line Tension on the Shape of Nanometer-Size Sessile Droplets
Impact of Negative Line Tension on the Shape of Nanometer-Size Sessile Droplets
复制标题
DOI：
10.1103/physrevlett.105.076103
复制
发表时间：
2010-08-13
影响因子：
8.6
通讯作者：
Riegler, Hans
中科院分区：
文献类型：
--
作者：
Berg, John K.;Weber, Constans M.;Riegler, Hans
用原子力显微镜（AFM）测量了纳米尺寸的固着富勒烯（C（60））液滴在平面SiO（2）界面上的接触角的尺寸依赖性，从而测量了线张力的符号和值。根据修正的杨氏方程的分析表明，负的线张力，其大小在-10（-11）和-10（-10）N/m之间，与理论预测非常一致。实验还表明，接触面积半径小于10 nm的液滴实际上是二维圆形台阶。
The sign and value of the line tension has been measured from the size dependence of the contact angle of nanometer-size sessile fullerene (C(60)) droplets on the planar SiO(2) interface, measured with atomic force microscopy (AFM). Analysis according to the modified Young's equation indicates a negative line tension, with a magnitude between -10(-11) and -10(-10) N/m, in good agreement with theoretical predictions. The experiments also indicate that droplets with contact area radii below 10 nm are in fact two-dimensional round terraces.