Deterministic Stellar BIST for In-System Automotive Test
Deterministic Stellar BIST for In-System Automotive Test
复制标题
用于系统内汽车测试的确定性 Stellar BIST
DOI：
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发表时间：
2018
期刊：
影响因子：
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通讯作者：
J. Tyszer
中科院分区：
文献类型：
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作者：
Yingdi Liu;N. Mukherjee;J. Rajski;S. Reddy;J. Tyszer
随着高级驾驶辅助系统和自动驾驶汽车中使用的非常复杂的安全关键组件越来越多，该领域的集成电路必须遵守功能安全标准驱动的高质量和长期可靠性的严格要求。这反过来又需要先进的测试解决方案来应对汽车零部件带来的挑战。本文介绍了Stellar BIST -一种用于在系统汽车测试的确定性两级压缩方案。所提出的解决方案无缝集成与任何顺序测试压缩方案，并利用这样一个事实，即某些集群的测试向量检测许多随机抗故障的集群由一个父模式及其转换衍生物。恒星BIST涉及基于可编码父模式的扫描切片的同时和多个互补来生成向量。多重互补也在连续模式之间偏斜以使所得测试多样化。新方案将压缩提升到传统的基于重新播种的解决方案无法实现的值，并在面积和时间之间进行了重大权衡，这对于系统内汽车应用至关重要。大型工业设计与固定和过渡故障的实验结果表明，所提出的测试方案的可行性，并在此报告。
With the growing number of very complex safety-critical components used in advanced driver assistance systems and autonomous vehicles, integrated circuits in this area must adhere to stringent requirements for high quality and long-term reliability driven by functional safety standards. This, in turn, requires advanced test solutions that have to respond to challenges posed by automotive parts. This paper presents Stellar BIST - a deterministic two-level compression scheme for in-system automotive test. The proposed solution seamlessly integrates with any sequential test compression scheme and takes advantage of the fact that certain clusters of test vectors detect many random-resistant faults where a cluster consists of a parent pattern and its transformed derivatives. Stellar BIST involves generating vectors based on simultaneous and multiple complements of scan slices of encodable parent patterns. The multiple complements are also skewed between successive patterns to diversify the resultant tests. The new scheme elevates compression to values unachievable through conventional reseeding-based solutions and provides significant trade-offs between area and time, critical for in-system automotive applications. Experimental results obtained for large industrial designs with stuck-at and transition faults illustrate feasibility of the proposed test scheme and are reported herein.