Reuse-based test access and integrated test scheduling for network-on-chip
Reuse-based test access and integrated test scheduling for network-on-chip
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基于重用的片上网络测试访问和集成测试调度
DOI：
10.1109/date.2006.244143
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发表时间：
2006
期刊：
影响因子：
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通讯作者：
D. Pradhan
中科院分区：
文献类型：
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作者：
Chunsheng Liu;Z. Link;D. Pradhan
提出了一种基于片上网络的测试访问和测试调度的新方法。它依赖于网络资源的逐步重用，用于将测试数据传输到路由器。我们提出了实施这一计划的可能的解决方案。我们还展示了如何路由器测试可以同时安排与核心测试，以减少测试应用程序的时间。ITC'02 SoC基准测试的实验结果表明，该方法可以导致显着减少的测试应用时间相比，以前的工作的基础上使用串行边界扫描。该方法还可以帮助减少硬件开销
In this paper, we propose a new method for test access and test scheduling in NoC-based system. It relies on a progressive reuse of the network resources for transporting test data to routers. We present possible solutions to the implementation of this scheme. We also show how the router testing can be scheduled concurrently with core testing to reduce test application time. Experimental results for the ITC'02 SoC benchmarks show that the proposed method can lead to substantial reduction on test application time compared to previous work based on the use of serial boundary scan. The method can also help to reduce hardware overhead