Method for assessing the spatiotemporal resolution of structured illumination microscopy (SIM).
Method for assessing the spatiotemporal resolution of structured illumination microscopy (SIM).
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DOI：
10.1364/boe.403592
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发表时间：
2021-02-01
影响因子：
3.4
通讯作者：
Rowlands CJ
中科院分区：
文献类型：
--
作者：
Boualam A;Rowlands CJ
提出了一种用于评估结构照明显微镜（SIM）的时间分辨率的方法，通过跟踪不同空间频率分量随时间的振幅，并将它们与时间振荡的地面实况进行比较。该方法用于深入了解SIM的性能限制，沿着声称可以提高时间分辨率的替代重建技术（称为“滚动SIM”）。结果表明，SIM的时间分辨率在低空间频率和高空间频率之间变化很大，并且，尽管被用于几个高知名度的论文和商业显微镜软件，滚动SIM提供的时间分辨率没有增加传统SIM。
A method is proposed for assessing the temporal resolution of structured illumination microscopy (SIM), by tracking the amplitude of different spatial frequency components over time, and comparing them to a temporally-oscillating ground-truth. This method is used to gain insight into the performance limits of SIM, along with alternative reconstruction techniques (termed ‘rolling SIM’) that claim to improve temporal resolution. Results show that the temporal resolution of SIM varies considerably between low and high spatial frequencies, and that, despite being used in several high profile papers and commercial microscope software, rolling SIM provides no increase in temporal resolution over conventional SIM.