Front-end electronics for imaging detectors
Front-end electronics for imaging detectors
复制标题
用于成像探测器的前端电子器件
DOI：
10.1016/s0168-9002(01)00963-9
复制
发表时间：
2000
影响因子：
1.4
通讯作者：
B. Yu
中科院分区：
文献类型：
--
作者：
G. Geronimo;P. O'connor;V. Radeka;B. Yu
本文综述了用于大像素数（105-107）成像探测器的前端电子学。给出了CMOS工艺下噪声极限与探测器电容和功耗的函数关系。有源矩阵平板成像器（AMFPI）进行了讨论，并说明其潜在的噪声性能。
Front-end electronics for imaging detectors with large numbers of pixels (105–107) is reviewed. The noise limits as a function of detector capacitance and power dissipation are presented for CMOS technology. Active matrix flat panel imagers (AMFPIs) are discussed and their potential noise performance is illustrated.