Hazard-aware statistical timing simulation and its applications in screening frequency-dependent defects

Hazard-aware statistical timing simulation and its applications in screening frequency-dependent defects
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危险感知统计时序模拟及其在筛查频率相关缺陷中的应用

DOI:
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发表时间:
2005
期刊:
IEEE International Conference on Test, 2005.
影响因子:
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通讯作者:
M. Abadir
M. Abadir
中科院分区:
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文献类型:
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作者:
Benjamin N. Lee;Hui Li;Li;M. Abadir

文献摘要

被引文献

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统计计时模拟的目的是评估过程变化对模式延迟的影响。在本文中,我们提出了一种新颖的危险统计计时模拟器。我们的模拟器以不确定性窗口的宽度为随机变量来表征定时危害。给定2个图形向量,模拟器将每个电路输出的过渡时间和不确定性窗口估计为两个单独的随机变量。我们证明,该模拟器比其前身具有更高的准确性和鲁棒性。通过改进的统计计时模拟器,我们从三个角度研究了其应用:(1)通过模式选择提高测试有效性(2)通过使用多个测试频率增强缺陷检测(3)扩展不同电压和温度的缺陷覆盖率。提出了实验结果,以证明在筛选频率依赖性缺陷的背景下使用统计计时模拟器的益处和局限性
The purpose of statistical timing simulation is to assess the impact of process variations on pattern delays. In this paper, we propose a novel hazard-aware statistical timing simulator. Our simulator characterizes timing hazards in terms of uncertainty windows whose widths are computed as random variables. Given a 2-pattern vector, the simulator estimates the transition times and uncertainty windows at each circuit output as two separate random variables. We demonstrate that this simulator achieves much higher accuracy and robustness than its predecessor. With this improved statistical timing simulator, we study its applications from three perspectives: (1) improving test effectiveness through pattern selection (2) enhancing defect detection by using multiple test frequencies (3) extending defect coverage for different voltages and temperatures. Experimental results are presented to demonstrate the benefits as well as the limitations of using the statistical timing simulator in the context of screening frequency-dependent defects