Graphene-Coated Atomic Force Microscope Tips for Reliable Nanoscale Electrical Characterization
Graphene-Coated Atomic Force Microscope Tips for Reliable Nanoscale Electrical Characterization
复制标题
石墨烯涂层原子力显微镜尖端可实现可靠的纳米级电气表征
DOI：
10.1002/adma.201204380
复制
发表时间：
2013-03-13
影响因子：
29.4
通讯作者：
Duan, H. L.
中科院分区：
文献类型：
--
作者：
Lanza, M.;Bayerl, A.;Duan, H. L.
石墨烯单层膜通过化学气相沉积生长，并转移到市售的原子力显微镜的导电尖端上。石墨烯涂层尖端比市售的金属涂漆导电原子力显微镜尖端更耐高电流和摩擦，由于尖端与样品的相互作用较低，因此寿命更长，成像更可靠。
Graphene single-layer films are grown by chemical vapor deposition and transferred onto commercially available conductive tips for atomic force microscopy. Graphene-coated tips are much more resistant to both high currents and frictions than commercially available, metal-varnished, conductive atomic force microscopy tips, leading to much larger lifetimes and more reliable imaging due to a lower tip-sample interaction.