Scanning laser imaging of dissipation in YBa2Cu3O7-δ-coated conductors
Scanning laser imaging of dissipation in YBa2Cu3O7-δ-coated conductors
复制标题
DOI：
10.1063/1.1794377
复制
发表时间：
2004-09-27
影响因子：
4
通讯作者：
Ustinov, AV
中科院分区：
文献类型：
--
作者：
Abraimov, D;Feldmann, DM;Ustinov, AV
我们用低温激光扫描显微镜(LTLSM)研究了高j(C)YBa2Cu3O7-Delta涂层导体中的直流电流流动，并关联了LTLSM对磁光成像(MOI)和晶界(GB)取向偏差的响应。由于LTLSM测量的电压响应与局部电场有关，而MOI显示的是局部磁场，这两种技术的结合清楚地表明，主要的耗散源和易磁通流动发生在GBs及其附近。通过将LTLSM图像与电子背散射衍射(EBSD)确定的颗粒取向图相关联，我们可以直接观察到通过与较高角度的银条相邻的小角度银条的电流路径的过载。(C)美国物理研究所。
We investigate dc-current flow in high-j(c) YBa2Cu3O7-delta-coated conductors by low-temperature laser scanning microscopy (LTLSM) and correlate the LTLSM response to magneto-optical imaging (MOI) and grain boundary (GB) misorientation. Because the voltage response measured by LTLSM is associated with the local electric field, while MOI shows the local magnetic field, the combination of these two techniques unambiguously shows that the dominant sources of dissipation and easy flux flow occur at and near GBs. By correlating LTLSM images to grain misorientation maps determined by electron backscatter diffraction (EBSD), we can directly observe the overloading of current paths through low-angle GBs neighboring higher-angle GBs. (C) American Institute of Physics.