A double toroidal analyzer for scanning probe electron energy spectrometer
A double toroidal analyzer for scanning probe electron energy spectrometer
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DOI:
10.1088/1674-1056/23/7/073402
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发表时间:
2014-05
影响因子:
1.7
通讯作者:
Chunkai Xu;Panke Zhang;Meng Li;Xiangjun Chen
中科院分区:
文献类型:
--
作者:
Chunkai Xu;Panke Zhang;Meng Li;Xiangjun Chen
An ultra-high vacuum (UHV) compatible electron spectrometer employing a double toroidal analyzer has been developed. It is designed to be combined with a custom-made scanning tunneling microscope (STM) to study the spatially localized electron energy spectrum on a surface. A tip—sample system composed of a piezo-driven field-emission tungsten tip and a sample of highly ordered pyrolytic graphite (HOPG) is employed to test the performance of the spectrometer. Two-dimensional images of the energy-resolved and angle-dispersed electrons backscattered from the surface of HOPG are obtained, the performance is optimized and the spectrometer is calibrated. A complete electron energy loss spectrum covering the elastic peak to the secondary electron peaks for the HOPG surface, acquired at a tip voltage of −140 V and a sample current of 0.5 pA, is presented, demonstrating the viability of the spectrometer.